An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science eBook

$28.00 $20.00

By: Sarah Fearn
Publisher: IOP Concise Physics
Print ISBN: 9781681740249, 1681740249
eText ISBN: 9781681740881, 1681740885
Format: Fixed
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science eBook

$28.00 $20.00

eText ISBN: 9781681740881 SKU: 9781681740881 Category: Tags: , Print ISBN: 9781681740249